Projects

Subtrate Thickness Measurement System
Automated system for precise substrate thickness measurement
Industry
Semiconductor Manufacturing
Timeline
9 months
Result
reliable measurements, high test throughput

Wafer Batch Split Tool
Manual wafer batch split tool
Industry
Semiconductor Manufacturing
Timeline
3 months
Result
precise, reliable wafer batch transfer

Automated Shore Hardness Measurement
Development and Integration of durometer module for automated shore hardness measurement
Industry
Semiconductor Manufacturing
Timeline
4 months
Result
automated in-line shore hardness measurement

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